* Mark interconnect as unstable
* Explicitly set unstable feature in HIL tests
* WIP append feature set name to artifact
* Add name to feature sets, build all combinations
* Fix tests
* Provide a looping executor for stable async tests
* Fix usb serial jtag
* Hide interconnect types
* Print panic messages using semihosting
* Don't use defmt's asserts
* Make RA_OFFSET available without panic-handler
* Re-add defmt imports where missing
* Revert unintended test change
* Initialise hal in critical-section test
* Disable defmt in tests by default
* Clean up qspi test cfgs, enable on ESP32
* Correct comments
* Clean up init_spi_data_mode
* Fix qspi_write on ESP32
* Further cleanup in SPI driver
* Clean up qspi_read
* Fix qspi_write_read test on ESP32
* Merge QSPI tests
* Clean up test
* Attempt to fix test GPIO assingment
* Update esp-hal/src/spi/master.rs
Co-authored-by: Dominic Fischer <14130965+Dominaezzz@users.noreply.github.com>
* Update esp-hal/src/spi/master.rs
* Make sure pins have no internal pullups
---------
Co-authored-by: Dominic Fischer <14130965+Dominaezzz@users.noreply.github.com>
* Remove type erased gpio structs
* Implement Peripheral for ErasedPin
* Simpler type erasing, accept ErasedPin in pin drivers, remove type erased drivers
* Reformulate pin drivers using Flex
* Erase gpio types by default
* Accept any pin in AnyPin
* Add changelog and migration guide
* Fix tests and examples
* Undo rename of clone_unchecked
* i2c hil test
* pin
* fmt
* Test
* WIP (gpio test left)
* Finalize the CODE part (to be cleaned up)
fmt
* Smaller cleanup
* cleanup
* rebase
* fix
* getting last chips ready
* Addressing reviews
